Vermont EPSCoR Publications and Products


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2007
Erturk M, Xia T, Clark WF. Gate Voltage Dependence of MOSFET Noise Statistics. IEEE Electron Device Letters [Internet]. 2007 [cited 0BC];28(9):812 - 814. Available from: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4294054