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Author Title Type [ Year] Filters: Author is M Erturk and First Letter Of Title is G [Clear All Filters]
Gate Voltage Dependence of MOSFET Noise Statistics. IEEE Electron Device Letters [Internet]. 2007 [cited 0BC];28(9):812 - 814. Available from: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4294054
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