Vermont EPSCoR Publications and Products


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2007
Erturk M, Xia T, Clark WF. Gate Voltage Dependence of MOSFET Noise Statistics. IEEE Electron Device Letters [Internet]. 2007 [cited 0BC];28(9):812 - 814. Available from: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4294054
Payne JL, Eppstein MJ, Goodnight CJ. Sensitivity of Self-Organized Speciation to Long-Disctance Dispersal. In: 2007 IEEE Symposium on Artificial Life2007 IEEE Symposium on Artificial Life. 2007 IEEE Symposium on Artificial Life2007 IEEE Symposium on Artificial Life. Honolulu, HI, USA: IEEE; 2007. pp. 1 - 7. Available from: http://www.cs.uvm.edu/~meppstei/personal/Payne_Speciation_IEEE07_aspublished.pdf

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