Vermont EPSCoR Publications and Products


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Journal Article
Smith JR, Xia T. High-Resolution Delay Testing of Interconnect Paths in Field-Programmable Gate Arrays. IEEE Transactions on Instrumentation and Measurement [Internet]. 2009 [cited 0BC];58(1):187 - 195. Available from: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04559395